Sweep I-V with a High Voltage Source HPP-120-256-IEEE and a Keithley 2400.
Scientific measurement library for instruments, experiments, and live-plotting. Dev new Instrument TEK-371B
semi automatic dut curves characterization seeker, launcher and data fetcher
Automatic and Parametric High Voltage Sweep
Characterization of DUT temperature dependent parameters using an Oven and a Multimeter
After-work engineering notes connecting materials science, semiconductor measurements, process monitoring, failure localization, and the evidence limits of inspection.
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