arrhenius-model

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saifar-tug / semiconductor-reliability-lifetime-analysis

End-to-end workflow on synthetic accelerated life test (ALT) data: dataset generation, Kaplan–Meier survival analysis, Weibull-2P modeling, and Arrhenius temperature acceleration. Includes Py scripts, Jupyter notebooks, plots, and CSV outputs.

reliability-engineering survival-analysis kaplan-meier semiconductor reliability-analysis data-science-projects failure-analysis weibull-analysis arrhenius-model

Updated Aug 16, 2025
Jupyter Notebook

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