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A simulation which can fit data from an ellipsometry measurement to provide the important data, namely the depth of a thin film, the refractive index of the film, the angle at which the light is incident, and the wavelength of light involved.
A simulation which can fit data from an ellipsometry measurement to provide the important data, namely the depth of a thin film, the refractive index of the film, the angle at which the light is incident, and the wavelength of light involved.
About
A simulation which can fit data from an ellipsometry measurement to provide the important data, namely the depth of a thin film, the refractive index of the film, the angle at which the light is incident, and the wavelength of light involved.
