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Re-written and cleaned-up code used to analyze the data in "Sample Processing and Benchmarking for Multibeam Optical Scanning Transmission Electron Microscopy", published in Microscopy and Microanalysis, 31 (2).

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Sample Processing and Benchmarking for Multibeam Optical Scanning Transmission Electron Microscopy.

This repository contains the re-written & cleaned-up code used to analyze the data in:

Duinkerken BHP, Kievits AJ, Wolters AHG, van Beijeren Bergen en Henegouwen D, Kuipers J, Hoogenboom JPH, & Giepmans BNG (2025). Sample Processing and Benchmarking for Multibeam Optical Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 31(2), ozaf024.

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As the original publication, this work is licensed under CC BY 4.0. To view a copy of this license, visit https://creativecommons.org/licenses/by/4.0/.

About

Re-written and cleaned-up code used to analyze the data in "Sample Processing and Benchmarking for Multibeam Optical Scanning Transmission Electron Microscopy", published in Microscopy and Microanalysis, 31 (2).

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